> grep SMART /var/log/messages Mar 4 01:47:44 cirithungol smartd[2825]: Device: /dev/sdc, Bad IEC (SMART) mode page, err=5, skip device Mar 4 01:47:44 cirithungol smartd[2825]: Device: /dev/sdd, Bad IEC (SMART) mode page, err=5, skip device Mar 4 01:47:44 cirithungol smartd[2825]: Device: /dev/sda, is SMART capable. Adding to "monitor" list. Mar 4 01:47:44 cirithungol smartd[2825]: Device: /dev/sdb, is SMART capable. Adding to "monitor" list. Mar 4 01:47:44 cirithungol smartd[2825]: Device: /dev/sdc, ATA IDENTIFY DEVICE words 82-83 don't specify if SMART capable. Mar 4 02:27:14 cirithungol smartd[2415]: Device: /dev/sda, is SMART capable. Adding to "monitor" list. Mar 4 02:27:14 cirithungol smartd[2415]: Device: /dev/sdb, is SMART capable. Adding to "monitor" list. Mar 4 02:57:16 cirithungol smartd[2417]: Device: /dev/sda, SMART Prefailure Attribute: 1 Raw_Read_Error_Rate changed from 73 to 74 Mar 4 02:57:16 cirithungol smartd[2417]: Device: /dev/sda, SMART Usage Attribute: 194 Temperature_Celsius changed from 39 to 40 Mar 4 02:57:16 cirithungol smartd[2417]: Device: /dev/sda, SMART Usage Attribute: 195 Hardware_ECC_Recovered changed from 73 to 74 Mar 4 02:57:16 cirithungol smartd[2417]: Device: /dev/sdb, SMART Prefailure Attribute: 1 Raw_Read_Error_Rate changed from 67 to 68 Mar 4 02:57:16 cirithungol smartd[2417]: Device: /dev/sdb, SMART Usage Attribute: 195 Hardware_ECC_Recovered changed from 67 to 68 Mar 4 03:27:15 cirithungol smartd[2417]: Device: /dev/sda, SMART Prefailure Attribute: 1 Raw_Read_Error_Rate changed from 74 to 73 Mar 4 03:27:15 cirithungol smartd[2417]: Device: /dev/sda, SMART Usage Attribute: 194 Temperature_Celsius changed from 40 to 39 Mar 4 03:27:15 cirithungol smartd[2417]: Device: /dev/sda, SMART Usage Attribute: 195 Hardware_ECC_Recovered changed from 74 to 73 Mar 4 03:27:15 cirithungol smartd[2417]: Device: /dev/sdb, SMART Usage Attribute: 194 Temperature_Celsius changed from 40 to 39 Mar 4 03:57:15 cirithungol smartd[2417]: Device: /dev/sda, SMART Prefailure Attribute: 1 Raw_Read_Error_Rate changed from 73 to 74 Mar 4 03:57:15 cirithungol smartd[2417]: Device: /dev/sda, SMART Usage Attribute: 194 Temperature_Celsius changed from 39 to 40 Mar 4 03:57:15 cirithungol smartd[2417]: Device: /dev/sda, SMART Usage Attribute: 195 Hardware_ECC_Recovered changed from 73 to 74 Mar 4 03:57:15 cirithungol smartd[2417]: Device: /dev/sdb, SMART Usage Attribute: 194 Temperature_Celsius changed from 39 to 40 Mar 4 04:57:16 cirithungol smartd[2417]: Device: /dev/sda, SMART Prefailure Attribute: 1 Raw_Read_Error_Rate changed from 74 to 75 Mar 4 04:57:16 cirithungol smartd[2417]: Device: /dev/sda, SMART Usage Attribute: 195 Hardware_ECC_Recovered changed from 74 to 75 Mar 4 04:57:16 cirithungol smartd[2417]: Device: /dev/sdb, SMART Prefailure Attribute: 1 Raw_Read_Error_Rate changed from 68 to 66 Mar 4 04:57:16 cirithungol smartd[2417]: Device: /dev/sdb, SMART Usage Attribute: 194 Temperature_Celsius changed from 40 to 39 Mar 4 04:57:16 cirithungol smartd[2417]: Device: /dev/sdb, SMART Usage Attribute: 195 Hardware_ECC_Recovered changed from 68 to 66 Mar 4 05:27:15 cirithungol smartd[2417]: Device: /dev/sda, SMART Prefailure Attribute: 1 Raw_Read_Error_Rate changed from 75 to 76 Mar 4 05:27:15 cirithungol smartd[2417]: Device: /dev/sda, SMART Usage Attribute: 195 Hardware_ECC_Recovered changed from 75 to 76 Mar 4 05:57:15 cirithungol smartd[2417]: Device: /dev/sda, SMART Usage Attribute: 194 Temperature_Celsius changed from 40 to 39 Mar 4 06:27:15 cirithungol smartd[2417]: Device: /dev/sda, SMART Prefailure Attribute: 1 Raw_Read_Error_Rate changed from 76 to 73 Mar 4 06:27:15 cirithungol smartd[2417]: Device: /dev/sda, SMART Usage Attribute: 195 Hardware_ECC_Recovered changed from 76 to 73 Mar 4 06:57:15 cirithungol smartd[2417]: Device: /dev/sda, SMART Prefailure Attribute: 1 Raw_Read_Error_Rate changed from 73 to 74 Mar 4 06:57:15 cirithungol smartd[2417]: Device: /dev/sda, SMART Usage Attribute: 195 Hardware_ECC_Recovered changed from 73 to 74 Mar 4 07:27:15 cirithungol smartd[2417]: Device: /dev/sda, SMART Prefailure Attribute: 1 Raw_Read_Error_Rate changed from 74 to 73 Mar 4 07:27:15 cirithungol smartd[2417]: Device: /dev/sda, SMART Usage Attribute: 195 Hardware_ECC_Recovered changed from 74 to 73 Mar 4 08:27:15 cirithungol smartd[2417]: Device: /dev/sda, SMART Prefailure Attribute: 1 Raw_Read_Error_Rate changed from 73 to 74 Mar 4 08:27:15 cirithungol smartd[2417]: Device: /dev/sda, SMART Usage Attribute: 195 Hardware_ECC_Recovered changed from 73 to 74 Mar 4 08:27:15 cirithungol smartd[2417]: Device: /dev/sdb, SMART Prefailure Attribute: 1 Raw_Read_Error_Rate changed from 66 to 67 Mar 4 08:27:15 cirithungol smartd[2417]: Device: /dev/sdb, SMART Usage Attribute: 195 Hardware_ECC_Recovered changed from 66 to 67 Mar 4 08:57:15 cirithungol smartd[2417]: Device: /dev/sda, SMART Usage Attribute: 194 Temperature_Celsius changed from 39 to 40 Mar 4 08:57:15 cirithungol smartd[2417]: Device: /dev/sdb, SMART Prefailure Attribute: 1 Raw_Read_Error_Rate changed from 67 to 66 Mar 4 08:57:15 cirithungol smartd[2417]: Device: /dev/sdb, SMART Usage Attribute: 195 Hardware_ECC_Recovered changed from 67 to 66 Mar 4 09:27:15 cirithungol smartd[2417]: Device: /dev/sda, SMART Prefailure Attribute: 1 Raw_Read_Error_Rate changed from 74 to 73 Mar 4 09:27:15 cirithungol smartd[2417]: Device: /dev/sda, SMART Usage Attribute: 195 Hardware_ECC_Recovered changed from 74 to 73 Mar 4 10:27:15 cirithungol smartd[2417]: Device: /dev/sda, SMART Prefailure Attribute: 1 Raw_Read_Error_Rate changed from 73 to 74 Mar 4 10:27:15 cirithungol smartd[2417]: Device: /dev/sda, SMART Usage Attribute: 195 Hardware_ECC_Recovered changed from 73 to 74 Mar 4 10:27:15 cirithungol smartd[2417]: Device: /dev/sdb, SMART Prefailure Attribute: 1 Raw_Read_Error_Rate changed from 66 to 67 Mar 4 10:27:15 cirithungol smartd[2417]: Device: /dev/sdb, SMART Usage Attribute: 195 Hardware_ECC_Recovered changed from 66 to 67 Mar 4 10:57:15 cirithungol smartd[2417]: Device: /dev/sda, SMART Prefailure Attribute: 1 Raw_Read_Error_Rate changed from 74 to 73 Mar 4 10:57:15 cirithungol smartd[2417]: Device: /dev/sda, SMART Usage Attribute: 195 Hardware_ECC_Recovered changed from 74 to 73 Mar 4 10:57:15 cirithungol smartd[2417]: Device: /dev/sdb, SMART Prefailure Attribute: 1 Raw_Read_Error_Rate changed from 67 to 66 Mar 4 10:57:15 cirithungol smartd[2417]: Device: /dev/sdb, SMART Usage Attribute: 194 Temperature_Celsius changed from 39 to 40 Mar 4 10:57:15 cirithungol smartd[2417]: Device: /dev/sdb, SMART Usage Attribute: 195 Hardware_ECC_Recovered changed from 67 to 66 Mar 4 11:27:16 cirithungol smartd[2417]: Device: /dev/sda, SMART Prefailure Attribute: 1 Raw_Read_Error_Rate changed from 73 to 74 Mar 4 11:27:16 cirithungol smartd[2417]: Device: /dev/sda, SMART Usage Attribute: 195 Hardware_ECC_Recovered changed from 73 to 74 Mar 4 12:27:15 cirithungol smartd[2417]: Device: /dev/sda, SMART Prefailure Attribute: 1 Raw_Read_Error_Rate changed from 74 to 75 Mar 4 12:27:15 cirithungol smartd[2417]: Device: /dev/sda, SMART Usage Attribute: 194 Temperature_Celsius changed from 40 to 41 Mar 4 12:27:15 cirithungol smartd[2417]: Device: /dev/sda, SMART Usage Attribute: 195 Hardware_ECC_Recovered changed from 74 to 75 Mar 4 12:57:16 cirithungol smartd[2417]: Device: /dev/sdb, SMART Prefailure Attribute: 1 Raw_Read_Error_Rate changed from 66 to 67 Mar 4 12:57:16 cirithungol smartd[2417]: Device: /dev/sdb, SMART Usage Attribute: 195 Hardware_ECC_Recovered changed from 66 to 67 Mar 4 13:27:15 cirithungol smartd[2417]: Device: /dev/sda, SMART Prefailure Attribute: 1 Raw_Read_Error_Rate changed from 75 to 73 Mar 4 13:27:15 cirithungol smartd[2417]: Device: /dev/sda, SMART Usage Attribute: 194 Temperature_Celsius changed from 41 to 42 Mar 4 13:27:15 cirithungol smartd[2417]: Device: /dev/sda, SMART Usage Attribute: 195 Hardware_ECC_Recovered changed from 75 to 73 Mar 4 13:27:15 cirithungol smartd[2417]: Device: /dev/sdb, SMART Prefailure Attribute: 1 Raw_Read_Error_Rate changed from 67 to 66 Mar 4 13:27:15 cirithungol smartd[2417]: Device: /dev/sdb, SMART Usage Attribute: 195 Hardware_ECC_Recovered changed from 67 to 66 Mar 4 13:57:15 cirithungol smartd[2417]: Device: /dev/sda, SMART Prefailure Attribute: 1 Raw_Read_Error_Rate changed from 73 to 74 Mar 4 13:57:15 cirithungol smartd[2417]: Device: /dev/sda, SMART Usage Attribute: 194 Temperature_Celsius changed from 42 to 41 Mar 4 13:57:15 cirithungol smartd[2417]: Device: /dev/sda, SMART Usage Attribute: 195 Hardware_ECC_Recovered changed from 73 to 74 Mar 4 13:57:16 cirithungol smartd[2417]: Device: /dev/sdb, SMART Usage Attribute: 194 Temperature_Celsius changed from 40 to 41 Mar 4 14:57:15 cirithungol smartd[2417]: Device: /dev/sda, SMART Prefailure Attribute: 1 Raw_Read_Error_Rate changed from 74 to 73 Mar 4 14:57:15 cirithungol smartd[2417]: Device: /dev/sda, SMART Usage Attribute: 195 Hardware_ECC_Recovered changed from 74 to 73 Mar 4 14:57:15 cirithungol smartd[2417]: Device: /dev/sdb, SMART Usage Attribute: 194 Temperature_Celsius changed from 41 to 40 Mar 4 15:27:15 cirithungol smartd[2417]: Device: /dev/sda, SMART Prefailure Attribute: 1 Raw_Read_Error_Rate changed from 73 to 74 Mar 4 15:27:15 cirithungol smartd[2417]: Device: /dev/sda, SMART Usage Attribute: 194 Temperature_Celsius changed from 41 to 42 Mar 4 15:27:15 cirithungol smartd[2417]: Device: /dev/sda, SMART Usage Attribute: 195 Hardware_ECC_Recovered changed from 73 to 74 Mar 4 15:57:15 cirithungol smartd[2417]: Device: /dev/sda, SMART Prefailure Attribute: 1 Raw_Read_Error_Rate changed from 74 to 75 Mar 4 15:57:15 cirithungol smartd[2417]: Device: /dev/sda, SMART Usage Attribute: 194 Temperature_Celsius changed from 42 to 41 Mar 4 15:57:15 cirithungol smartd[2417]: Device: /dev/sda, SMART Usage Attribute: 195 Hardware_ECC_Recovered changed from 74 to 75 Mar 4 16:27:15 cirithungol smartd[2417]: Device: /dev/sda, SMART Prefailure Attribute: 1 Raw_Read_Error_Rate changed from 75 to 74 Mar 4 16:27:15 cirithungol smartd[2417]: Device: /dev/sda, SMART Usage Attribute: 195 Hardware_ECC_Recovered changed from 75 to 74 Mar 4 16:57:16 cirithungol smartd[2417]: Device: /dev/sda, SMART Prefailure Attribute: 1 Raw_Read_Error_Rate changed from 74 to 73 Mar 4 16:57:16 cirithungol smartd[2417]: Device: /dev/sda, SMART Usage Attribute: 194 Temperature_Celsius changed from 41 to 39 Mar 4 16:57:16 cirithungol smartd[2417]: Device: /dev/sda, SMART Usage Attribute: 195 Hardware_ECC_Recovered changed from 74 to 73 Mar 4 16:57:16 cirithungol smartd[2417]: Device: /dev/sdb, SMART Usage Attribute: 194 Temperature_Celsius changed from 40 to 38 Mar 4 17:27:15 cirithungol smartd[2417]: Device: /dev/sda, SMART Prefailure Attribute: 1 Raw_Read_Error_Rate changed from 73 to 74 Mar 4 17:27:15 cirithungol smartd[2417]: Device: /dev/sda, SMART Usage Attribute: 194 Temperature_Celsius changed from 39 to 37 Mar 4 17:27:15 cirithungol smartd[2417]: Device: /dev/sda, SMART Usage Attribute: 195 Hardware_ECC_Recovered changed from 73 to 74 Mar 4 17:27:15 cirithungol smartd[2417]: Device: /dev/sdb, SMART Usage Attribute: 194 Temperature_Celsius changed from 38 to 37 Mar 4 17:57:15 cirithungol smartd[2417]: Device: /dev/sda, SMART Prefailure Attribute: 1 Raw_Read_Error_Rate changed from 74 to 73 Mar 4 17:57:15 cirithungol smartd[2417]: Device: /dev/sda, SMART Usage Attribute: 195 Hardware_ECC_Recovered changed from 74 to 73 Mar 4 17:57:16 cirithungol smartd[2417]: Device: /dev/sdb, SMART Usage Attribute: 194 Temperature_Celsius changed from 37 to 36 Mar 4 18:27:15 cirithungol smartd[2417]: Device: /dev/sda, SMART Prefailure Attribute: 1 Raw_Read_Error_Rate changed from 73 to 74 Mar 4 18:27:15 cirithungol smartd[2417]: Device: /dev/sda, SMART Usage Attribute: 194 Temperature_Celsius changed from 37 to 39 Mar 4 18:27:15 cirithungol smartd[2417]: Device: /dev/sda, SMART Usage Attribute: 195 Hardware_ECC_Recovered changed from 73 to 74 Mar 4 18:27:15 cirithungol smartd[2417]: Device: /dev/sdb, SMART Usage Attribute: 194 Temperature_Celsius changed from 36 to 38 Mar 4 18:57:15 cirithungol smartd[2417]: Device: /dev/sda, SMART Usage Attribute: 194 Temperature_Celsius changed from 39 to 40 Mar 4 18:57:16 cirithungol smartd[2417]: Device: /dev/sdb, SMART Prefailure Attribute: 1 Raw_Read_Error_Rate changed from 66 to 67 Mar 4 18:57:16 cirithungol smartd[2417]: Device: /dev/sdb, SMART Usage Attribute: 194 Temperature_Celsius changed from 38 to 39 Mar 4 18:57:16 cirithungol smartd[2417]: Device: /dev/sdb, SMART Usage Attribute: 195 Hardware_ECC_Recovered changed from 66 to 67 Mar 4 19:27:15 cirithungol smartd[2417]: Device: /dev/sda, SMART Prefailure Attribute: 1 Raw_Read_Error_Rate changed from 74 to 75 Mar 4 19:27:15 cirithungol smartd[2417]: Device: /dev/sda, SMART Usage Attribute: 195 Hardware_ECC_Recovered changed from 74 to 75 Mar 4 19:27:15 cirithungol smartd[2417]: Device: /dev/sdb, SMART Usage Attribute: 194 Temperature_Celsius changed from 39 to 40 Mar 4 19:57:15 cirithungol smartd[2417]: Device: /dev/sda, SMART Prefailure Attribute: 1 Raw_Read_Error_Rate changed from 75 to 74 Mar 4 19:57:15 cirithungol smartd[2417]: Device: /dev/sda, SMART Usage Attribute: 195 Hardware_ECC_Recovered changed from 75 to 74 Mar 4 20:27:15 cirithungol smartd[2417]: Device: /dev/sda, SMART Prefailure Attribute: 1 Raw_Read_Error_Rate changed from 74 to 72 Mar 4 20:27:15 cirithungol smartd[2417]: Device: /dev/sda, SMART Usage Attribute: 195 Hardware_ECC_Recovered changed from 74 to 72 Mar 4 20:27:16 cirithungol smartd[2417]: Device: /dev/sdb, SMART Prefailure Attribute: 1 Raw_Read_Error_Rate changed from 67 to 66 Mar 4 20:27:16 cirithungol smartd[2417]: Device: /dev/sdb, SMART Usage Attribute: 195 Hardware_ECC_Recovered changed from 67 to 66 Mar 4 20:51:28 cirithungol smartd[2838]: Device: /dev/sdc, Bad IEC (SMART) mode page, err=5, skip device Mar 4 20:51:28 cirithungol smartd[2838]: Device: /dev/sdd, Bad IEC (SMART) mode page, err=5, skip device Mar 4 20:51:28 cirithungol smartd[2838]: Device: /dev/sda, is SMART capable. Adding to "monitor" list. Mar 4 20:51:28 cirithungol smartd[2838]: Device: /dev/sdb, is SMART capable. Adding to "monitor" list. Mar 4 20:51:28 cirithungol smartd[2838]: Device: /dev/sdc, ATA IDENTIFY DEVICE words 82-83 don't specify if SMART capable. Mar 4 21:21:30 cirithungol smartd[2843]: Device: /dev/sdb, SMART Prefailure Attribute: 1 Raw_Read_Error_Rate changed from 67 to 66 Mar 4 21:21:30 cirithungol smartd[2843]: Device: /dev/sdb, SMART Usage Attribute: 194 Temperature_Celsius changed from 41 to 40 Mar 4 21:21:30 cirithungol smartd[2843]: Device: /dev/sdb, SMART Usage Attribute: 195 Hardware_ECC_Recovered changed from 67 to 66 Mar 4 21:51:29 cirithungol smartd[2843]: Device: /dev/sda, SMART Prefailure Attribute: 1 Raw_Read_Error_Rate changed from 73 to 74 Mar 4 21:51:29 cirithungol smartd[2843]: Device: /dev/sda, SMART Usage Attribute: 195 Hardware_ECC_Recovered changed from 73 to 74 Mar 4 22:21:29 cirithungol smartd[2843]: Device: /dev/sda, SMART Prefailure Attribute: 1 Raw_Read_Error_Rate changed from 74 to 73 Mar 4 22:21:29 cirithungol smartd[2843]: Device: /dev/sda, SMART Usage Attribute: 195 Hardware_ECC_Recovered changed from 74 to 73 Mar 4 22:51:30 cirithungol smartd[2843]: Device: /dev/sda, SMART Prefailure Attribute: 1 Raw_Read_Error_Rate changed from 73 to 74 Mar 4 22:51:30 cirithungol smartd[2843]: Device: /dev/sda, SMART Usage Attribute: 195 Hardware_ECC_Recovered changed from 73 to 74 Mar 5 00:21:29 cirithungol smartd[2843]: Device: /dev/sda, SMART Prefailure Attribute: 1 Raw_Read_Error_Rate changed from 74 to 73 Mar 5 00:21:29 cirithungol smartd[2843]: Device: /dev/sda, SMART Usage Attribute: 195 Hardware_ECC_Recovered changed from 74 to 73 Mar 5 00:51:30 cirithungol smartd[2843]: Device: /dev/sdb, SMART Prefailure Attribute: 1 Raw_Read_Error_Rate changed from 66 to 67 Mar 5 00:51:30 cirithungol smartd[2843]: Device: /dev/sdb, SMART Usage Attribute: 194 Temperature_Celsius changed from 40 to 39 Mar 5 00:51:30 cirithungol smartd[2843]: Device: /dev/sdb, SMART Usage Attribute: 195 Hardware_ECC_Recovered changed from 66 to 67 Mar 5 01:21:29 cirithungol smartd[2843]: Device: /dev/sdb, SMART Usage Attribute: 194 Temperature_Celsius changed from 39 to 40 Mar 5 01:51:29 cirithungol smartd[2843]: Device: /dev/sda, SMART Prefailure Attribute: 1 Raw_Read_Error_Rate changed from 73 to 74 Mar 5 01:51:29 cirithungol smartd[2843]: Device: /dev/sda, SMART Usage Attribute: 195 Hardware_ECC_Recovered changed from 73 to 74 Mar 5 02:21:29 cirithungol smartd[2843]: Device: /dev/sdb, SMART Prefailure Attribute: 1 Raw_Read_Error_Rate changed from 67 to 68 Mar 5 02:21:29 cirithungol smartd[2843]: Device: /dev/sdb, SMART Usage Attribute: 195 Hardware_ECC_Recovered changed from 67 to 68 Mar 5 02:51:29 cirithungol smartd[2843]: Device: /dev/sdb, SMART Usage Attribute: 194 Temperature_Celsius changed from 40 to 39 Mar 5 03:21:29 cirithungol smartd[2843]: Device: /dev/sda, SMART Prefailure Attribute: 1 Raw_Read_Error_Rate changed from 74 to 72 Mar 5 03:21:29 cirithungol smartd[2843]: Device: /dev/sda, SMART Usage Attribute: 195 Hardware_ECC_Recovered changed from 74 to 72 Mar 5 03:21:29 cirithungol smartd[2843]: Device: /dev/sdb, SMART Usage Attribute: 194 Temperature_Celsius changed from 39 to 40 Mar 5 03:51:29 cirithungol smartd[2843]: Device: /dev/sda, SMART Prefailure Attribute: 1 Raw_Read_Error_Rate changed from 72 to 73 Mar 5 03:51:29 cirithungol smartd[2843]: Device: /dev/sda, SMART Usage Attribute: 195 Hardware_ECC_Recovered changed from 72 to 73 Mar 5 03:51:29 cirithungol smartd[2843]: Device: /dev/sdb, SMART Usage Attribute: 194 Temperature_Celsius changed from 40 to 39 Mar 5 04:21:29 cirithungol smartd[2843]: Device: /dev/sda, SMART Prefailure Attribute: 1 Raw_Read_Error_Rate changed from 73 to 72 Mar 5 04:21:29 cirithungol smartd[2843]: Device: /dev/sda, SMART Usage Attribute: 194 Temperature_Celsius changed from 40 to 39 Mar 5 04:21:29 cirithungol smartd[2843]: Device: /dev/sda, SMART Usage Attribute: 195 Hardware_ECC_Recovered changed from 73 to 72 Mar 5 04:21:30 cirithungol smartd[2843]: Device: /dev/sdb, SMART Prefailure Attribute: 1 Raw_Read_Error_Rate changed from 68 to 67 Mar 5 04:21:30 cirithungol smartd[2843]: Device: /dev/sdb, SMART Usage Attribute: 195 Hardware_ECC_Recovered changed from 68 to 67 Mar 5 04:51:29 cirithungol smartd[2843]: Device: /dev/sda, SMART Prefailure Attribute: 1 Raw_Read_Error_Rate changed from 72 to 74 Mar 5 04:51:29 cirithungol smartd[2843]: Device: /dev/sda, SMART Usage Attribute: 194 Temperature_Celsius changed from 39 to 40 Mar 5 04:51:29 cirithungol smartd[2843]: Device: /dev/sda, SMART Usage Attribute: 195 Hardware_ECC_Recovered changed from 72 to 74 Mar 5 04:51:29 cirithungol smartd[2843]: Device: /dev/sdb, SMART Prefailure Attribute: 1 Raw_Read_Error_Rate changed from 67 to 68 Mar 5 04:51:29 cirithungol smartd[2843]: Device: /dev/sdb, SMART Usage Attribute: 195 Hardware_ECC_Recovered changed from 67 to 68 Mar 5 05:21:29 cirithungol smartd[2843]: Device: /dev/sda, SMART Usage Attribute: 194 Temperature_Celsius changed from 40 to 39 Mar 5 05:21:30 cirithungol smartd[2843]: Device: /dev/sdb, SMART Usage Attribute: 194 Temperature_Celsius changed from 39 to 38 Mar 5 05:51:29 cirithungol smartd[2843]: Device: /dev/sda, SMART Prefailure Attribute: 1 Raw_Read_Error_Rate changed from 74 to 73 Mar 5 05:51:29 cirithungol smartd[2843]: Device: /dev/sda, SMART Usage Attribute: 195 Hardware_ECC_Recovered changed from 74 to 73 Mar 5 05:51:29 cirithungol smartd[2843]: Device: /dev/sdb, SMART Prefailure Attribute: 1 Raw_Read_Error_Rate changed from 68 to 67 Mar 5 05:51:29 cirithungol smartd[2843]: Device: /dev/sdb, SMART Usage Attribute: 195 Hardware_ECC_Recovered changed from 68 to 67 Mar 5 06:21:29 cirithungol smartd[2843]: Device: /dev/sda, SMART Prefailure Attribute: 1 Raw_Read_Error_Rate changed from 73 to 74 Mar 5 06:21:29 cirithungol smartd[2843]: Device: /dev/sda, SMART Usage Attribute: 195 Hardware_ECC_Recovered changed from 73 to 74 Mar 5 07:51:29 cirithungol smartd[2843]: Device: /dev/sda, SMART Prefailure Attribute: 1 Raw_Read_Error_Rate changed from 74 to 73 Mar 5 07:51:29 cirithungol smartd[2843]: Device: /dev/sda, SMART Usage Attribute: 195 Hardware_ECC_Recovered changed from 74 to 73 Mar 5 08:21:30 cirithungol smartd[2843]: Device: /dev/sda, SMART Usage Attribute: 194 Temperature_Celsius changed from 39 to 40 Mar 5 08:21:30 cirithungol smartd[2843]: Device: /dev/sdb, SMART Usage Attribute: 194 Temperature_Celsius changed from 38 to 39 Mar 5 09:21:29 cirithungol smartd[2843]: Device: /dev/sda, SMART Prefailure Attribute: 1 Raw_Read_Error_Rate changed from 73 to 74 Mar 5 09:21:29 cirithungol smartd[2843]: Device: /dev/sda, SMART Usage Attribute: 195 Hardware_ECC_Recovered changed from 73 to 74 Mar 5 09:21:29 cirithungol smartd[2843]: Device: /dev/sdb, SMART Usage Attribute: 194 Temperature_Celsius changed from 39 to 40 Mar 5 09:51:30 cirithungol smartd[2843]: Device: /dev/sdb, SMART Usage Attribute: 194 Temperature_Celsius changed from 40 to 39 Mar 5 10:21:29 cirithungol smartd[2843]: Device: /dev/sdb, SMART Usage Attribute: 194 Temperature_Celsius changed from 39 to 40 Mar 5 11:51:29 cirithungol smartd[2843]: Device: /dev/sdb, SMART Prefailure Attribute: 1 Raw_Read_Error_Rate changed from 67 to 66 Mar 5 11:51:29 cirithungol smartd[2843]: Device: /dev/sdb, SMART Usage Attribute: 195 Hardware_ECC_Recovered changed from 67 to 66 Mar 5 12:21:29 cirithungol smartd[2843]: Device: /dev/sda, SMART Prefailure Attribute: 1 Raw_Read_Error_Rate changed from 74 to 75 Mar 5 12:21:29 cirithungol smartd[2843]: Device: /dev/sda, SMART Usage Attribute: 195 Hardware_ECC_Recovered changed from 74 to 75 Mar 5 12:51:30 cirithungol smartd[2843]: Device: /dev/sda, SMART Prefailure Attribute: 1 Raw_Read_Error_Rate changed from 75 to 73 Mar 5 12:51:30 cirithungol smartd[2843]: Device: /dev/sda, SMART Usage Attribute: 195 Hardware_ECC_Recovered changed from 75 to 73 > smartctl --all /dev/sda smartctl version 5.37 [i386-redhat-linux-gnu] Copyright (C) 2002-6 Bruce Allen Home page is http://smartmontools.sourceforge.net/ === START OF INFORMATION SECTION === Model Family: Seagate Barracuda ATA IV family Device Model: ST340016A Serial Number: 3HS5967V Firmware Version: 3.75 User Capacity: 40,020,664,320 bytes Device is: In smartctl database [for details use: -P show] ATA Version is: 5 ATA Standard is: Exact ATA specification draft version not indicated Local Time is: Wed Mar 5 13:52:26 2008 PST SMART support is: Available - device has SMART capability. SMART support is: Enabled === START OF READ SMART DATA SECTION === SMART overall-health self-assessment test result: PASSED General SMART Values: Offline data collection status: (0x82) Offline data collection activity was completed without error. Auto Offline Data Collection: Enabled. Self-test execution status: ( 0) The previous self-test routine completed without error or no self-test has ever been run. Total time to complete Offline data collection: ( 421) seconds. Offline data collection capabilities: (0x1b) SMART execute Offline immediate. Auto Offline data collection on/off support. Suspend Offline collection upon new command. Offline surface scan supported. Self-test supported. No Conveyance Self-test supported. No Selective Self-test supported. SMART capabilities: (0x0003) Saves SMART data before entering power-saving mode. Supports SMART auto save timer. Error logging capability: (0x01) Error logging supported. No General Purpose Logging support. Short self-test routine recommended polling time: ( 1) minutes. Extended self-test routine recommended polling time: ( 31) minutes. SMART Attributes Data Structure revision number: 10 Vendor Specific SMART Attributes with Thresholds: ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE 1 Raw_Read_Error_Rate 0x000f 073 061 034 Pre-fail Always - 178337265 3 Spin_Up_Time 0x0003 092 087 000 Pre-fail Always - 0 4 Start_Stop_Count 0x0032 100 100 020 Old_age Always - 103 5 Reallocated_Sector_Ct 0x0033 100 100 036 Pre-fail Always - 0 7 Seek_Error_Rate 0x000f 078 060 030 Pre-fail Always - 66563212 9 Power_On_Hours 0x0032 065 065 000 Old_age Always - 31486 10 Spin_Retry_Count 0x0013 100 100 097 Pre-fail Always - 0 12 Power_Cycle_Count 0x0032 099 099 020 Old_age Always - 1979 194 Temperature_Celsius 0x0022 041 051 000 Old_age Always - 41 195 Hardware_ECC_Recovered 0x001a 073 061 000 Old_age Always - 178337265 197 Current_Pending_Sector 0x0012 100 100 000 Old_age Always - 0 198 Offline_Uncorrectable 0x0010 100 100 000 Old_age Offline - 0 199 UDMA_CRC_Error_Count 0x003e 200 200 000 Old_age Always - 0 200 Multi_Zone_Error_Rate 0x0000 100 253 000 Old_age Offline - 0 202 TA_Increase_Count 0x0032 100 253 000 Old_age Always - 0 SMART Error Log Version: 1 No Errors Logged SMART Self-test log structure revision number 1 Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error # 1 Extended offline Completed without error 00% 31486 - # 2 Short captive Completed without error 00% 9407 - # 3 Extended offline Aborted by host 50% 0 - Device does not support Selective Self Tests/Logging > smartctl --all /dev/sdb smartctl version 5.37 [i386-redhat-linux-gnu] Copyright (C) 2002-6 Bruce Allen Home page is http://smartmontools.sourceforge.net/ === START OF INFORMATION SECTION === Model Family: Seagate Barracuda ATA IV family Device Model: ST340016A Serial Number: 3HS54X56 Firmware Version: 3.75 User Capacity: 40,020,664,320 bytes Device is: In smartctl database [for details use: -P show] ATA Version is: 5 ATA Standard is: Exact ATA specification draft version not indicated Local Time is: Wed Mar 5 13:52:31 2008 PST SMART support is: Available - device has SMART capability. SMART support is: Enabled === START OF READ SMART DATA SECTION === SMART overall-health self-assessment test result: PASSED General SMART Values: Offline data collection status: (0x82) Offline data collection activity was completed without error. Auto Offline Data Collection: Enabled. Self-test execution status: ( 0) The previous self-test routine completed without error or no self-test has ever been run. Total time to complete Offline data collection: ( 421) seconds. Offline data collection capabilities: (0x1b) SMART execute Offline immediate. Auto Offline data collection on/off support. Suspend Offline collection upon new command. Offline surface scan supported. Self-test supported. No Conveyance Self-test supported. No Selective Self-test supported. SMART capabilities: (0x0003) Saves SMART data before entering power-saving mode. Supports SMART auto save timer. Error logging capability: (0x01) Error logging supported. No General Purpose Logging support. Short self-test routine recommended polling time: ( 1) minutes. Extended self-test routine recommended polling time: ( 31) minutes. SMART Attributes Data Structure revision number: 10 Vendor Specific SMART Attributes with Thresholds: ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE 1 Raw_Read_Error_Rate 0x000f 066 060 034 Pre-fail Always - 154613141 3 Spin_Up_Time 0x0003 091 087 000 Pre-fail Always - 0 4 Start_Stop_Count 0x0032 100 100 020 Old_age Always - 885 5 Reallocated_Sector_Ct 0x0033 100 100 036 Pre-fail Always - 0 7 Seek_Error_Rate 0x000f 088 060 030 Pre-fail Always - 673763033 9 Power_On_Hours 0x0032 065 065 000 Old_age Always - 30914 10 Spin_Retry_Count 0x0013 100 100 097 Pre-fail Always - 0 12 Power_Cycle_Count 0x0032 099 099 020 Old_age Always - 1977 194 Temperature_Celsius 0x0022 040 049 000 Old_age Always - 40 195 Hardware_ECC_Recovered 0x001a 066 060 000 Old_age Always - 154613141 197 Current_Pending_Sector 0x0012 100 100 000 Old_age Always - 0 198 Offline_Uncorrectable 0x0010 100 100 000 Old_age Offline - 0 199 UDMA_CRC_Error_Count 0x003e 200 200 000 Old_age Always - 0 200 Multi_Zone_Error_Rate 0x0000 100 253 000 Old_age Offline - 0 202 TA_Increase_Count 0x0032 100 253 000 Old_age Always - 0 SMART Error Log Version: 1 No Errors Logged SMART Self-test log structure revision number 1 Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error # 1 Short captive Completed without error 00% 9363 - # 2 Extended offline Aborted by host 30% 0 - Device does not support Selective Self Tests/Logging